In this paper, we demonstrate an approach that allows for reliably and rapidly (at timescales below 30 ms) varying the synthetic wavelength arbitrarily across multiple orders of magnitude which are prerequisites for dynamically reconfigurable multi-wavelength interferometry. Multi-wavelength optical information processing systems are commonly utilized in optical neural networks and broadband signal processing. However, their effectiveness is often compromised by frequency-selective responses caused by fabrication, transmission, and environmental factors. We provide electrical, physical, and mechanical calibration for a wide variety of systems, subsystems, test. Single-wavelength interferometry achieves high resolution for smooth surfaces but struggles with rough, industrially relevant ones due to limited unambiguous measuring range and speckle effects. For those customers who wish to do their own.
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